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20260219_E-202_Surana.PDF

上传人: 彩旗 编号:1158886 2026-03-02 19页 2.59MB

1、Verification of a Silicon BridgeSatish Surana IntelSr.Principal Engineer in Advanced Packaging Technology and ManufacturingSadha Parasuraman IntelDesign Methodology EngineerMichael Walsh Siemens EDATechnical Director IC Packaging and 3DIC SolutionsAbstractWith silicon interposer technologies reachin

2、g their limits due to reticle size constraints,silicon bridge solutions are emerging as the solution of choice for HPC applications.Silicon bridge solutions offer comparable performance with the advantage of larger size substrates allowing for more compute and memory.A state of the art silicon bridg

3、e based substrate poses a complex verification challenge.Die scaling,bump compensation,and the sheer volume of interconnect between die all contribute to the complex verification required to satisfy DRC and LVS.Intel Foundry and Siemens have worked together to provide a robust 3DIC verification proc

4、ess which addresses the challenges of the verification task.This paper will outline the challenges,describe a solution,and recommend best practices to allow design teams close verification quickly and the confidence the design is correct and tapeout ready.1/30/2026Intel Foundry|Siemens EDA|3DIC Veri

5、fication|Chiplet Summit 2026|MW2Intel EMIB TechnologyAdvanced applications,such as AI,machine learning(ML),and high-performance computing(HPC),require high data throughput and low latency.Embedded Multi-die Interconnect Bridge(EMIB)improves semiconductor designs performance,power efficiency,and flex

6、ibility.EMIB enables you to integrate more components as needed,making it easier to scale up performance and functionality without complete system redesigns.EMIB is the industrys first 2.5D interconnect solution using bridges embedded in the substrate.In high-volume manufacturing since 2017,EMIB fea

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1. **技术背景**:硅桥接(Silicon Bridge)技术因硅中介体(Interposer)受光刻机限制,成为HPC高性能计算首选方案,提供更大尺寸基板以支持更多计算与内存。 2. **验证挑战**:多芯片、多EMIB(嵌入式多芯片互连桥)的复杂封装需解决芯片缩放、凸点补偿、CTE(热膨胀系数)对齐及DRC/LVS(设计规则/版图与原理图一致性)检查。 3. **解决方案**:Intel与Siemens合作采用Innovator3D IC + Calibre 3DStack流程,支持物理对齐(凸点重叠/中心校准)、逻辑连通性检查(BGA到芯片凸点路径),并支持增量验证与“白盒”EMIB芯片全检查。 4. **最佳实践**:早期进行凸点对齐检查、明确网络命名(避免EMIB两侧同名)、增量验证,确保设计快速收敛且tapeout就绪。
**EMIB技术优势?** (吸引关注高性能计算和半导体设计的读者,突出EMIB的核心价值。) **3D验证难点?** (针对工程师和设计团队,引发对复杂封装验证挑战的兴趣。) **验证流程优化?** (面向实际应用场景,强调如何提升效率和可靠性,吸引注重流程优化的受众。)
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