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20260219_A-201_Deo.PDF

上传人: 彩旗 编号:1158869 2026-03-02 14页 1.13MB

1、Engineering Resilient IC PackagesSudarshan Deo,Andras Vass-Varnai,Bharad Gundepudi3D IC Solutions EngineeringSiemens DISWMotivationReticle SizeHeterogeneous Intg.ModularizationCostYieldBandwidth(Memory)Explosive adoption of AI,HPC,and heterogeneous computing2.5D/3D IC packaging is now essential for

2、performance scalingMechanical reliability challenges grow dramatically:High power densitiesMaterial CTE mismatches 3D geometries and stacked memoryTraditional workflows isolate electrical and mechanical teams too slow,too lateRestricted|Siemens 2025|Siemens Digital Industries SoftwarePage 2How is me

3、chanical analysis different for 3DIC?Restricted|Siemens 2025|Siemens Digital Industries SoftwarePage 3Traditional flows handle:Thermal modeling separate from electrical designMechanical modeling created manually late in the cycleReliability prediction performed only for mature designsThis leads to:L

4、ate-stage failuresCostly redesignsPoor cross-team communicationIntegrated thermo-mechanical design and modeling flowUnrestricted|Siemens 2026|Siemens Digital Industries SoftwareSynchronize 2.5/3D designs with thermo-mechanical modeling Facilitate collaboration among IC designer,package architect and

5、 simulation analyst Automate multiphysics model building and setupLeverage market leading technologies in Siemens,such as Calibre,Simcenter Simlab and FlothermI3D Reliability ToolkitThermal/mechanical modelsSimcenter FlothermPage 4Innovator3D IC SiP level modeling architectural to sign-off cockpit S

6、imcenter Simlab Stress/Warpage/Vibration/ReliabilityCalibre 3DThermalECAD/MCAD fileCalibre 3DStressPhysics covered:-Thermal-Stress/strain-Vibration(fatigue)-Thermal/power cycling fatigueExperimental Package OverviewUnrestricted|Siemens 2026|Siemens Digital Industries SoftwareThe selected package is

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1. **背景与挑战**:AI/HPC推动2.5D/3D IC封装成必需,但高功率密度、CTE失配及传统电气/机械团队隔离导致可靠性问题(如后期故障、高成本重设计)。 2. **解决方案**:集成热-机械设计流程,自动化多物理模型构建,利用Siemens Calibre、Simcenter Simlab/Flotherm技术,实现跨团队协作。 3. **核心数据**: - 封装尺寸:25×15mm,含1个PU芯片+8个HBM(双堆叠)。 - 热模拟结果:翘曲量约6μm,疲劳寿命约82,200小时(Nf×循环时间)。 4. **方法创新**:多保真度建模(详细/简化/均匀化)+全局-局部子模型,提升寿命预测效率。 5. **结论**:减少手动工作,加速设计周期,验证高可靠性;下一步将细化金属层、模拟组装过程。
**3D封装挑战?** **热机械协同?** **寿命预测新法?**
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