DCON26_PAPER_Track04_AnImprovedBroadbandMaterialCharacterizationMethod_49_17.pdf

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1、 Information Classification:General An improved broadband material characterization method Feng-Nan(Leon),Wu,Samtec Leon.W,+886 939163668 Xingling(Mick),Zhou,Samtec Mick.Z Tony,Chen,Samtec Tony.C Information Classification:General Abstract We propose an enhanced broadband material characterization t

2、echnique for extracting dielectric constant(Dk)and loss tangent(Df)in high-speed interconnect applications.The method uses two coaxial airlines of different lengths(50mm and 60mm),measured with and without the material under test(MUT),combined with Automatic Fixture Removal(AFR)for precise S-paramet

3、er de-embedding.This technique avoids reference-plane alignment and physical length dependency by leveraging propagation constant relationships which differ from NRW/NIST approaches.Closed-form equations derived from multilayer lossy coaxial theory eliminate metal loss and geometric tolerances.The D

4、jordjevicSarkar model extends bandwidth beyond 40GHz,validated through 3D-printed HT200 samples and Swissto12 waveguide kit measurements.Results demonstrate accuracy,scalability,and immunity to manufacturing tolerances,enabling future characterization up to 100GHz and beyond.Author(s)Biography Leon

5、Wu has 21 years of industry experience as an SI engineer having worked at FCI,Flextronics and Samtec.He received his Ph.D.from the National Taipei University of Technology in 2013.Leon works in the SI lab at Samtec Taipei and Dongguan facility which focus on connector measurements.He also performs f

6、ull wave simulations which support research efforts.He has 6 patents related to connector/footprint design.Xingling(Mick)Zhou received a PhD in electrical engineering with an emphasis in electromagnetic theory and microwave engineering from Arizona State University(ASU)in 2001.He has more than 24 ye