Aehr Test Systems (AEHR) 2021年年度报告「NASDAQ」.pdf

1、2021 Annual ReportMeeting the Production Test and Burn-in Needs of Semiconductor Devices for Electric Vehicles,Solar Power Conversion,Data Center and 5G Infrastructure,and Mobile and Wearable DevicesAehr Test Systems(in thousands,except per share data)For the years ended May 31,2021 2020 2019 Net sa

2、les$16,600$22,291$21,056 Loss from operations(4,182)(2,765)(5,000)Net loss attributable to common shareholders (2,027)(2,802)(5,235)Net loss per share-diluted (0.09)(0.12)(0.23)Cash and cash equivalents 4,582 5,433 5,428 Working capital 10,123 13,786 14,522 Shareholders equity 11,449 14,056 15,453 T

3、he ABTSTM Advanced Burn-In and Test System is Aehr Tests family of Test During Burn-In systems for packaged parts.It is being used for many applications in the mobility and automotive markets.It can be configured with up to 320 I/O channels and up to 72 Burn-in boards for testing and burning-in adva

4、nced logic devices.It offers an individual device temperature control option for higher-power applications such as applications processors.Aehr Tests patented WaferPak Contactor and DiePakCarriers connect electrical test resources from Aehrs FOX systems to the customers wafer or singulated die/modul

5、es to be tested or burned-in.Both products contain micro-miniature probes to contact all the die/modules in a single insertion.The FOX-P platform can be used in a wide range of test and reliability screening(burn-in)applications for high reliability applications,such as automotive,mobile devices,net

6、working,telecommunications,sensors,photonics and laser devices.The FOXTM-XP Burn-in and Test System is designed for single-touchdown testing of up to 18 wafers at a time and for testing singulated die or small modules.The FOX-NP is a low-cost entry-level system to provide a configuration and price p