Aehr Test Systems (AEHR) 2017年年度报告「NASDAQ」.pdf

1、2017 Annual Report Aehr Test Systems FOX-XP Multi-Wafer Test&Burn-in System(in thousands,except per share data)For the years ended May 31,2017 2016 2015 Net sales$18,898$14,501$10,018 Loss from operations (4,929)(6,154)(6,694)Net loss attributable to common shareholders (5,653)(6,785)(6,647)Net loss

2、 per share-diluted (0.35)(0.52)(0.55)Cash and cash equivalents 17,803 939 5,527 Working capital 21,494 4,068 7,776 Shareholders equity(deficit)16,794 (723)4,550 The ABTSTM Advanced Burn-In and Test System is the latest product in Aehr Tests family of Test During Burn-In systems for packaged parts.It

3、 is being used for many applications in the mobility and automotive markets.It can be configured with up to 320 I/O channels and up to 72 Burn-in boards for testing and burning-in advanced logic devices.It offers an individual device temperature control option for higher-power applications such as a

4、pplications processors.Aehr Tests patented WaferPak Cartridges and DiePak Carriers connect electrical test resources from Aehrs FOX systems to the customers wafer or singulated die/modules to be tested or burned-in.Both designs contain micro-miniature probes to contact all the die/modules in a singl

5、e insertion.WaferPak Cartridges and DiePak Carriers are custom designed for each customers unique application.When used in a FOX system,both configurations are capable of supplying power and removing up to 2kW of heat energy per WaferPak Cartridge or DiePak Carrier.The FOXTM-XP Multi-Wafer Burn-in a

6、nd Test System,publicly introduced in July 2016,is designed for single-touchdown testing of up to 18 wafers at a time.A single test cell with a WaferPakTM Aligner and three FOX-XP systems can test up to 54 wafers at a time.The FOX-XP system can be used in a wide range of test and reliability screeni